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![]() This commit adds unit tests for ADC uclass's methods using sandbox ADC. Testing proper ADC binding: - dm_test_adc_bind() - device binding - dm_test_adc_wrong_channel_selection() - checking wrong channel selection Testing ADC supply operations: - dm_test_adc_supply(): - Vdd/Vss values validating - Vdd regulator updated value validating - Vdd regulator's auto enable state validating Testing ADC operations results: - dm_test_adc_single_channel_conversion() - single channel start/data - dm_test_adc_single_channel_shot() - single channel shot - dm_test_adc_multi_channel_conversion() - multi channel start/data - dm_test_adc_multi_channel_shot() - multi channel single shot Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Cc: Simon Glass <sjg@chromium.org> Signed-off-by: Minkyu Kang <mk7.kang@samsung.com> |
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.. | ||
dfu | ||
dm | ||
env | ||
fs | ||
image | ||
stdint | ||
trace | ||
ums | ||
vboot | ||
cmd_repeat.sh | ||
cmd_ut.c | ||
command_ut.c | ||
common.sh | ||
compression.c | ||
Kconfig | ||
Makefile | ||
time_ut.c | ||
ut.c |