u-boot-brain/test/dm/sf.c
Joe Hershberger e721b882e9 test: Generalize the unit test framework
Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.

Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
2015-05-21 09:16:16 -04:00

44 lines
1.2 KiB
C

/*
* Copyright (C) 2013 Google, Inc
*
* SPDX-License-Identifier: GPL-2.0+
*/
#include <common.h>
#include <dm.h>
#include <fdtdec.h>
#include <spi.h>
#include <spi_flash.h>
#include <asm/state.h>
#include <dm/test.h>
#include <dm/util.h>
#include <test/ut.h>
/* Test that sandbox SPI flash works correctly */
static int dm_test_spi_flash(struct unit_test_state *uts)
{
/*
* Create an empty test file and run the SPI flash tests. This is a
* long way from being a unit test, but it does test SPI device and
* emulator binding, probing, the SPI flash emulator including
* device tree decoding, plus the file-based backing store of SPI.
*
* More targeted tests could be created to perform the above steps
* one at a time. This might not increase test coverage much, but
* it would make bugs easier to find. It's not clear whether the
* benefit is worth the extra complexity.
*/
ut_asserteq(0, run_command_list(
"sb save hostfs - 0 spi.bin 200000;"
"sf probe;"
"sf test 0 10000", -1, 0));
/*
* Since we are about to destroy all devices, we must tell sandbox
* to forget the emulation device
*/
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
return 0;
}
DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);