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![]() This commit adds unit tests for ADC uclass's methods using sandbox ADC. Testing proper ADC binding: - dm_test_adc_bind() - device binding - dm_test_adc_wrong_channel_selection() - checking wrong channel selection Testing ADC supply operations: - dm_test_adc_supply(): - Vdd/Vss values validating - Vdd regulator updated value validating - Vdd regulator's auto enable state validating Testing ADC operations results: - dm_test_adc_single_channel_conversion() - single channel start/data - dm_test_adc_single_channel_shot() - single channel shot - dm_test_adc_multi_channel_conversion() - multi channel start/data - dm_test_adc_multi_channel_shot() - multi channel single shot Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Cc: Simon Glass <sjg@chromium.org> Signed-off-by: Minkyu Kang <mk7.kang@samsung.com> |
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.. | ||
adc.c | ||
bus.c | ||
clk.c | ||
cmd_dm.c | ||
core.c | ||
eth.c | ||
gpio.c | ||
i2c.c | ||
Kconfig | ||
led.c | ||
Makefile | ||
mmc.c | ||
pci.c | ||
pmic.c | ||
ram.c | ||
regmap.c | ||
regulator.c | ||
remoteproc.c | ||
reset.c | ||
rtc.c | ||
sf.c | ||
spi.c | ||
syscon.c | ||
test-dm.sh | ||
test-driver.c | ||
test-fdt.c | ||
test-main.c | ||
test-uclass.c | ||
usb.c |