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![Simon Glass](/assets/img/avatar_default.png)
All driver-model functions should have a device as the first parameter. Update this function accordingly. Signed-off-by: Simon Glass <sjg@chromium.org> Reviewed-by: Andy Shevchenko <andy.shevchenko@gmail.com>
70 lines
1.9 KiB
C
70 lines
1.9 KiB
C
// SPDX-License-Identifier: GPL-2.0
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/*
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* Copyright (c) 2018, STMicroelectronics
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*/
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#include <common.h>
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#include <serial.h>
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#include <dm.h>
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#include <dm/test.h>
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#include <test/ut.h>
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static int dm_test_serial(struct unit_test_state *uts)
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{
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struct serial_device_info info_serial = {0};
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struct udevice *dev_serial;
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uint value_serial;
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ut_assertok(uclass_get_device_by_name(UCLASS_SERIAL, "serial",
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&dev_serial));
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ut_assertok(serial_tstc());
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/*
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* test with default config which is the only one supported by
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* sandbox_serial driver
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*/
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ut_assertok(serial_setconfig(dev_serial, SERIAL_DEFAULT_CONFIG));
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ut_assertok(serial_getconfig(dev_serial, &value_serial));
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ut_assert(value_serial == SERIAL_DEFAULT_CONFIG);
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ut_assertok(serial_getinfo(dev_serial, &info_serial));
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ut_assert(info_serial.type == SERIAL_CHIP_UNKNOWN);
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ut_assert(info_serial.addr == SERIAL_DEFAULT_ADDRESS);
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/*
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* test with a parameter which is NULL pointer
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*/
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ut_asserteq(-EINVAL, serial_getconfig(dev_serial, NULL));
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ut_asserteq(-EINVAL, serial_getinfo(dev_serial, NULL));
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/*
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* test with a serial config which is not supported by
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* sandbox_serial driver: test with wrong parity
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*/
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ut_asserteq(-ENOTSUPP,
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serial_setconfig(dev_serial,
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SERIAL_CONFIG(SERIAL_PAR_ODD,
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SERIAL_8_BITS,
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SERIAL_ONE_STOP)));
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/*
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* test with a serial config which is not supported by
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* sandbox_serial driver: test with wrong bits number
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*/
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ut_asserteq(-ENOTSUPP,
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serial_setconfig(dev_serial,
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SERIAL_CONFIG(SERIAL_PAR_NONE,
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SERIAL_6_BITS,
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SERIAL_ONE_STOP)));
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/*
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* test with a serial config which is not supported by
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* sandbox_serial driver: test with wrong stop bits number
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*/
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ut_asserteq(-ENOTSUPP,
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serial_setconfig(dev_serial,
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SERIAL_CONFIG(SERIAL_PAR_NONE,
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SERIAL_8_BITS,
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SERIAL_TWO_STOP)));
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return 0;
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}
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DM_TEST(dm_test_serial, DM_TESTF_SCAN_FDT);
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