The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.
This will allow adding other test flags without confusion.
Signed-off-by: Simon Glass <sjg@chromium.org>
These header file should not be included in other header files. Remove
them and add to each individual file. Add test/test.h to test/ui.h since
that is a reasonable place.
Signed-off-by: Simon Glass <sjg@chromium.org>
Quite a few tests still use ut_assertok(memcmp(...)) and variants. Modify
them to use the macro designed for this purpose.
Suggested-by: Wolfgang Wallner <wolfgang.wallner@br-automation.com>
Signed-off-by: Simon Glass <sjg@chromium.org>
Reviewed-by: Wolfgang Wallner <wolfgang.wallner@br-automation.com>
Add support for setting the chip address offset mask to EEPROM sumulator
and add tests to test it.
Signed-off-by: Robert Beckett <bob.beckett@collabora.com>
Reviewed-by: Heiko Schocher <hs@denx.de>
Improve i2c EEPROM simulator testing by providing access functions to
check the previous chip addr and offset.
Given that we can now directly test the offsets, also simplified the
offset mapping and allow for wrapping acceses.
Signed-off-by: Robert Beckett <bob.beckett@collabora.com>
Reviewed-by: Heiko Schocher <hs@denx.de>
When U-Boot started using SPDX tags we were among the early adopters and
there weren't a lot of other examples to borrow from. So we picked the
area of the file that usually had a full license text and replaced it
with an appropriate SPDX-License-Identifier: entry. Since then, the
Linux Kernel has adopted SPDX tags and they place it as the very first
line in a file (except where shebangs are used, then it's second line)
and with slightly different comment styles than us.
In part due to community overlap, in part due to better tag visibility
and in part for other minor reasons, switch over to that style.
This commit changes all instances where we have a single declared
license in the tag as both the before and after are identical in tag
contents. There's also a few places where I found we did not have a tag
and have introduced one.
Signed-off-by: Tom Rini <trini@konsulko.com>
Quite a few places have a bind() method which just calls dm_scan_fdt_dev().
We may as well call dm_scan_fdt_dev() directly. Update the code to do this.
Signed-off-by: Simon Glass <sjg@chromium.org>
Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.
Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
At present this driver has a few test features. They are needed for running
the driver model unit tests but are confusing and unnecessary if using
sandbox at the command line. Add a flag to enable the test mode, and don't
enable it by default.
Signed-off-by: Simon Glass <sjg@chromium.org>
As with i2c_read() and i2c_write(), add a dm_ prefix to the driver model
versions of these functions to avoid conflicts.
Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: Heiko Schocher <hs@denx.de>
Rather than assuming that the chip offset length is 1, allow it to be
provided. This allows chips that don't use the default offset length to
be used (at present they are only supported by the command line 'i2c'
command which sets the offset length explicitly).
Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: Heiko Schocher <hs@denx.de>
Add a dm_ prefix to driver model I2C functions so that we can keep the old
ones around.
This is a little unfortunate, but on reflection it is too difficult to
change the API. We can undo this rename when most boards and drivers are
converted to use driver model for I2C.
Signed-off-by: Simon Glass <sjg@chromium.org>
