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dm: usb: Clean up USB after each test

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The USB subsystem has a few counters that need to be reset since they are
stored in static variables rather than driver-model data. An example is
usb_max_devs. Ultimately we should move this data into the USB uclass.

For now, make sure that USB is reset after each test, so that the counters
go back to zero.

Note: this is not a perfect solution: It a USB test fails it will exit
immediately and leave USB un-reset. The impact here is that it may cause
subsequence test failures in the same run.

Signed-off-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Simon Glass 2016-02-29 15:26:02 -07:00
parent 07b2b78ce4
commit 61ccd886e2
1 changed files with 2 additions and 0 deletions
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2
test/dm/usb.c
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@ -52,6 +52,7 @@ static int dm_test_usb_flash(struct unit_test_state *uts)
memset(cmp, '\0', sizeof(cmp));
ut_asserteq(2, blk_dread(dev_desc, 0, 2, cmp));
ut_assertok(strcmp(cmp, "this is a test"));
ut_assertok(usb_stop());
return 0;
}
@ -67,6 +68,7 @@ static int dm_test_usb_multi(struct unit_test_state *uts)
ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 1, &dev));
ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 2, &dev));
ut_assertok(usb_stop());
return 0;
}